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3.23 Electrical, Optical, and Magnetic Properties of Materials (MIT) 3.23 Electrical, Optical, and Magnetic Properties of Materials (MIT)

Description

This class discusses the origin of electrical, magnetic and optical properties of materials, with a focus on the acquisition of quantum mechanical tools. It begins with an analysis of the properties of materials, presentation of the postulates of quantum mechanics, and close examination of the hydrogen atom, simple molecules and bonds, and the behavior of electrons in solids and energy bands. Introducing the variation principle as a method for the calculation of wavefunctions, the course continues with investigation of how and why materials respond to different electrical, magnetic and electromagnetic fields and probes and study of the conductivity, dielectric function, and magnetic permeability in metals, semiconductors, and insulators. A survey of common devices such as transistors, magn This class discusses the origin of electrical, magnetic and optical properties of materials, with a focus on the acquisition of quantum mechanical tools. It begins with an analysis of the properties of materials, presentation of the postulates of quantum mechanics, and close examination of the hydrogen atom, simple molecules and bonds, and the behavior of electrons in solids and energy bands. Introducing the variation principle as a method for the calculation of wavefunctions, the course continues with investigation of how and why materials respond to different electrical, magnetic and electromagnetic fields and probes and study of the conductivity, dielectric function, and magnetic permeability in metals, semiconductors, and insulators. A survey of common devices such as transistors, magn

Subjects

quantum mechanics | quantum mechanics | functional materials | functional materials | magnetic domains | magnetic domains | particle wells | particle wells | spintronics | spintronics | semiconductor engineering | semiconductor engineering | p-n junction | p-n junction | luminescence | luminescence | nanoparticles | nanoparticles | phonons | phonons

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see http://ocw.mit.edu/terms/index.htm

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Magnetic Materials and Devices (MIT) Magnetic Materials and Devices (MIT)

Description

This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. The class uses a device-motivated approach which emphasizes emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance. This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. The class uses a device-motivated approach which emphasizes emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance.

Subjects

electrical | optical | and magnetic devices | electrical | optical | and magnetic devices | microstructural characteristics of materials | microstructural characteristics of materials | device-motivated approach | device-motivated approach | emerging technologies | emerging technologies | physical phenomena | physical phenomena | electrical conductivity | electrical conductivity | doping | doping | transistors | transistors | photodectors | photodectors | photovoltaics | photovoltaics | luminescence | luminescence | light emitting diodes | light emitting diodes | lasers | lasers | optical phenomena | optical phenomena | photonics | photonics | ferromagnetism | ferromagnetism | magnetoresistance | magnetoresistance

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see http://ocw.mit.edu/terms/index.htm

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12.141 Electron Microprobe Analysis (MIT) 12.141 Electron Microprobe Analysis (MIT)

Description

Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.Offered for undergraduate credit, but persons interested in an in-depth discussion of quantitative x-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit. Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.Offered for undergraduate credit, but persons interested in an in-depth discussion of quantitative x-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit.

Subjects

x-ray microanalysis | x-ray microanalysis | electron microprobe | electron microprobe | ZAF matrix corrections | ZAF matrix corrections | wavelength and energy dispersive spectrometry | wavelength and energy dispersive spectrometry | scanning backscattered electron | scanning backscattered electron | secondary electron | secondary electron | cathodoluminescence | cathodoluminescence | X-ray imaging | X-ray imaging

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see http://ocw.mit.edu/terms/index.htm

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Magnetic Materials and Devices (MIT) Magnetic Materials and Devices (MIT)

Description

This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. It features a device-motivated approach which places strong emphasis on emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance. This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. It features a device-motivated approach which places strong emphasis on emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance.

Subjects

electrical | optical | and magnetic devices | electrical | optical | and magnetic devices | microstructural characteristics of materials | microstructural characteristics of materials | device-motivated approach | device-motivated approach | emerging technologies | emerging technologies | physical phenomena | physical phenomena | electrical conductivity | electrical conductivity | doping | doping | transistors | transistors | photodectors | photodectors | photovoltaics | photovoltaics | luminescence | luminescence | light emitting diodes | light emitting diodes | lasers | lasers | optical phenomena | optical phenomena | photonics | photonics | ferromagnetism | ferromagnetism | magnetoresistance | magnetoresistance | electrical devices | electrical devices | optical devices | optical devices | magnetic devices | magnetic devices | materials | materials | device applications | device applications

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see http://ocw.mit.edu/terms/index.htm

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12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry (MIT) 12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry (MIT)

Description

This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe. This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe.

Subjects

x-ray microanalysis | x-ray microanalysis | electron microprobe | electron microprobe | ZAF matrix corrections | ZAF matrix corrections | wavelength and energy dispersive spectrometry | wavelength and energy dispersive spectrometry | scanning backscattered electron | scanning backscattered electron | secondary electron | secondary electron | cathodoluminescence | cathodoluminescence | and X-ray imaging | and X-ray imaging

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see http://ocw.mit.edu/terms/index.htm

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12.141 Electron Microprobe Analysis (MIT) 12.141 Electron Microprobe Analysis (MIT)

Description

The electron microprobe provides a complete micrometer-scale quantitative chemical analysis of inorganic solids. The method is nondestructive and utilizes characteristic X-rays excited by an electron beam incident on a flat surface of the sample. This course provides an introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix correction procedures and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), X-ray using WDS or EDS (elemental mapping), and cathodoluminescence (CL). Lab sessions involve hands-on use of the JEOL JXA-8200 Superprobe. The electron microprobe provides a complete micrometer-scale quantitative chemical analysis of inorganic solids. The method is nondestructive and utilizes characteristic X-rays excited by an electron beam incident on a flat surface of the sample. This course provides an introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix correction procedures and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), X-ray using WDS or EDS (elemental mapping), and cathodoluminescence (CL). Lab sessions involve hands-on use of the JEOL JXA-8200 Superprobe.

Subjects

electron microprobe | electron microprobe | x-ray microanalysis | x-ray microanalysis | x-ray imaging | x-ray imaging | ZAF matrix corrections | ZAF matrix corrections | wavelength | wavelength | energy dispersive spectrometry | energy dispersive spectrometry | scanning backscattered electron | scanning backscattered electron | secondary electron | secondary electron | cathodoluminescence | cathodoluminescence

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see http://ocw.mit.edu/terms/index.htm

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3.23 Electrical, Optical, and Magnetic Properties of Materials (MIT)

Description

This class discusses the origin of electrical, magnetic and optical properties of materials, with a focus on the acquisition of quantum mechanical tools. It begins with an analysis of the properties of materials, presentation of the postulates of quantum mechanics, and close examination of the hydrogen atom, simple molecules and bonds, and the behavior of electrons in solids and energy bands. Introducing the variation principle as a method for the calculation of wavefunctions, the course continues with investigation of how and why materials respond to different electrical, magnetic and electromagnetic fields and probes and study of the conductivity, dielectric function, and magnetic permeability in metals, semiconductors, and insulators. A survey of common devices such as transistors, magn

Subjects

quantum mechanics | functional materials | magnetic domains | particle wells | spintronics | semiconductor engineering | p-n junction | luminescence | nanoparticles | phonons

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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Magnetic Materials and Devices (MIT)

Description

This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. The class uses a device-motivated approach which emphasizes emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance.

Subjects

electrical | optical | and magnetic devices | microstructural characteristics of materials | device-motivated approach | emerging technologies | physical phenomena | electrical conductivity | doping | transistors | photodectors | photovoltaics | luminescence | light emitting diodes | lasers | optical phenomena | photonics | ferromagnetism | magnetoresistance

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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12.141 Electron Microprobe Analysis (MIT)

Description

Introduction to the theory of x-ray microanalysis through the electron microprobe including ZAF matrix corrections. Techniques to be discussed are wavelength and energy dispersive spectrometry, scanning backscattered electron, secondary electron, cathodoluminescence, and X-ray imaging. Lab sessions involve hands-on use of the electron microprobe.Offered for undergraduate credit, but persons interested in an in-depth discussion of quantitative x-ray analysis are invited to participate. Students will be required to complete lab exercises to obtain credit.

Subjects

x-ray microanalysis | electron microprobe | ZAF matrix corrections | wavelength and energy dispersive spectrometry | scanning backscattered electron | secondary electron | cathodoluminescence | X-ray imaging

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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12.141 Electron Microprobe Analysis (MIT)

Description

The electron microprobe provides a complete micrometer-scale quantitative chemical analysis of inorganic solids. The method is nondestructive and utilizes characteristic X-rays excited by an electron beam incident on a flat surface of the sample. This course provides an introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix correction procedures and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), X-ray using WDS or EDS (elemental mapping), and cathodoluminescence (CL). Lab sessions involve hands-on use of the JEOL JXA-8200 Superprobe.

Subjects

electron microprobe | x-ray microanalysis | x-ray imaging | ZAF matrix corrections | wavelength | energy dispersive spectrometry | scanning backscattered electron | secondary electron | cathodoluminescence

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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Magnetic Materials and Devices (MIT)

Description

This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. It features a device-motivated approach which places strong emphasis on emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance.

Subjects

electrical | optical | and magnetic devices | microstructural characteristics of materials | device-motivated approach | emerging technologies | physical phenomena | electrical conductivity | doping | transistors | photodectors | photovoltaics | luminescence | light emitting diodes | lasers | optical phenomena | photonics | ferromagnetism | magnetoresistance | electrical devices | optical devices | magnetic devices | materials | device applications

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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Magnetic Materials and Devices (MIT)

Description

This course explores the relationships which exist between the performance of electrical, optical, and magnetic devices and the microstructural characteristics of the materials from which they are constructed. The class uses a device-motivated approach which emphasizes emerging technologies. Device applications of physical phenomena are considered, including electrical conductivity and doping, transistors, photodetectors and photovoltaics, luminescence, light emitting diodes, lasers, optical phenomena, photonics, ferromagnetism, and magnetoresistance.

Subjects

electrical | optical | and magnetic devices | microstructural characteristics of materials | device-motivated approach | emerging technologies | physical phenomena | electrical conductivity | doping | transistors | photodectors | photovoltaics | luminescence | light emitting diodes | lasers | optical phenomena | photonics | ferromagnetism | magnetoresistance

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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12.141 Electron Microprobe Analysis by Wavelength Dispersive X-ray Spectrometry (MIT)

Description

This lab-oriented course introduces the student to the subject of X-ray spectrometry and micro-scale chemical quantitative analysis of solid samples through an intensive series of hands-on laboratory exercises that use the electron microprobe.

Subjects

x-ray microanalysis | electron microprobe | ZAF matrix corrections | wavelength and energy dispersive spectrometry | scanning backscattered electron | secondary electron | cathodoluminescence | and X-ray imaging

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

Site sourced from

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Attribution

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12.141 Electron Microprobe Analysis (MIT)

Description

The electron microprobe provides a complete micrometer-scale quantitative chemical analysis of inorganic solids. The method is nondestructive and utilizes characteristic X-rays excited by an electron beam incident on a flat surface of the sample. This course provides an introduction to the theory of X-ray microanalysis through wavelength and energy dispersive spectrometry (WDS and EDS), ZAF matrix correction procedures and scanning electron imaging with back-scattered electron (BSE), secondary electron (SE), X-ray using WDS or EDS (elemental mapping), and cathodoluminescence (CL). Lab sessions involve hands-on use of the JEOL JXA-8200 Superprobe.

Subjects

electron microprobe | x-ray microanalysis | x-ray imaging | ZAF matrix corrections | wavelength | energy dispersive spectrometry | scanning backscattered electron | secondary electron | cathodoluminescence

License

Content within individual OCW courses is (c) by the individual authors unless otherwise noted. MIT OpenCourseWare materials are licensed by the Massachusetts Institute of Technology under a Creative Commons License (Attribution-NonCommercial-ShareAlike). For further information see https://ocw.mit.edu/terms/index.htm

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